JEOL JCM-7000 NeoScope

Benchtop Scanning Electron Microscope

Products > Optical Microscope > Scanning Electron Microscope

Simple operation, Seamless Navigation, Live Analysis

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.

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JEOL Zeromag & Live Analysis

JEOL Live 3D

*Photos and video courtesy of JEOL official website


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