JEOL JCM-7000 NeoScope

Benchtop Scanning Electron Microscope

Products > Optical Microscope > Scanning Electron Microscope


Simple operation, Seamless Navigation, Live Analysis


The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.

Ask for Demo >>

JEOL Zeromag & Live Analysis

JEOL Live 3D

*Photos and video courtesy of JEOL official website

About

Phone: (+852) 2784 0630
WhatsApp: (+852) 9404 6983
Email: sales@ctschina.com.hk
Working Hour: 0900-1730

Follow Us

Made with ‌

Mobirise.com